C. Boller, Saarland University M. Buderath, AIRBUS S. Dehlau, German Society for Non-Destructive Testing E. Niederleithinger, BAM J. Prager, BAM P. Wierach, German Aerospace Center |
O. Bareille, Ecole Centrale de Lyon, France C. Boller, Saarland University, Germany B. Chapuis, CEA, France E. Chatzi, ETH Zurich, Switzerland F. Cegla, Imperial College, United Kingdom F.K. Chang, Stanford University, USA A. Cicirello, TU Delft, Netherlands Á. Cunha, University of Porto, Portugal A. Cusano, Unversity of Sannio, Italy M. Döhler, Inria, France Z. Fan, Nanyang Technology University, Singapore S. D. Fassois, University of Patras, Greece V. Giurgiutiu, University of South Carolina, USA B. Glisic, Princeton University, USA M. Gresil, Monash University, Australia A. Güemes, UPM, Spain Ł. Jankowski, Polish Academy of Sciences (IPPT PAN); Poland I. Kressel, IAI, Israel P. Kudela, Polish Academy of Sciences, Poland J. Kullaa, Metropolia University of Applied Sciences, Finland V. Le Cam, Gustave Eiffel University, France M. P. Limongelli, Politecnico di Milano, Italy |
N. Mechbal, Arts et Métiers ParisTech (ENSAM), France L. Mevel, Inria, France J. Moll, Goethe University, Germany L. E. Mujica, Universitat Politècnica de Catalunya, Spain Y.Q. Ni, Hong Kong Polytechnic University, China E. Niederleithinger, BAM, Germany W. Ostachowicz, Polish Academy of Sciences, Poland C.Papadimitriou, University of Thessaly, Greece S.G. Pierce, Strathclyde University; United Kingdom P. Rizzo, University of Pittsburgh, USA D. Saravanos, University of Patras, Greece H. Sohn, KAIST, South Korea W.J. Staszewski, AGH University of Science and Technology, Poland Z. Su, Hong Kong Polytechnic University, China M. Tur, Tel-Aviv University, Israel T. Uhl, AGH University of Science and Technology, Poland S. Yuan, Nanjing University of Aeronautics and Astronautics, China D. Zonta, University of Trento, Italy |